Statistical characterization of radiation-induced pulse waveforms and flip-flop soft errors in 14nm tri-gate CMOS using a back-sampling chain (BSC) technique

التفاصيل البيبلوغرافية
العنوان:	Statistical characterization of radiation-induced pulse waveforms and flip-flop soft errors in 14nm tri-gate CMOS using a back-sampling chain (BSC) technique
المؤلفون:	Kumar, Saurabh, Cho, Minki, Everson, Luke, Kim, Hoonki, Tang, Qianying, Mazanec, Paul, Meinerzhagen, Pascal, Malavasi, Andres, Lake, Dan, Tokunaga, Carlos, Quinn, Heather, Khellah, Muhammad, Tschanz, James, Borkar, Shekhar, De, Vivek, Kim, Chris H.
المصدر:	2017 Symposium on VLSI Technology VLSI Technology, 2017 Symposium on. :C114-C115 Jun, 2017
Relation:	2017 Symposium on VLSI Technology
قاعدة البيانات:	IEEE Xplore Digital Library