Session-less test scheduling for multi-tower 3D-SICs

التفاصيل البيبلوغرافية
العنوان: Session-less test scheduling for multi-tower 3D-SICs
المؤلفون: Wenming Wang, Xiaole Cui, Mengying Luo, Yang Hu, Shengming Zhou
المصدر: 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) Solid-State and Integrated Circuit Technology (ICSICT), 2016 13th IEEE International Conference on. :1395-1397 Oct, 2016
Relation: 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781467397179
9781467397193
9781467397186
DOI:10.1109/ICSICT.2016.7998749