Effects of Current Stress for Low Temperature Cu/Sn/Cu Solid-State-Diffusion Bonding

التفاصيل البيبلوغرافية
العنوان: Effects of Current Stress for Low Temperature Cu/Sn/Cu Solid-State-Diffusion Bonding
المؤلفون: Cai, Jian, Wang, Junqiang, Wang, Qian, Wu, Zijian, Wang, Dejun
المصدر: 2017 IEEE 67th Electronic Components and Technology Conference (ECTC) ECTC Electronic Components and Technology Conference (ECTC), 2017 IEEE 67th. :1742-1747 May, 2017
Relation: 2017 IEEE 67th Electronic Components and Technology Conference (ECTC)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781509063154
تدمد:23775726
DOI:10.1109/ECTC.2017.96