Voltage-controlled magnetic tunnel junction based MRAM for replacing high density DRAM circuits corresponding to 2X nm generation

التفاصيل البيبلوغرافية
العنوان: Voltage-controlled magnetic tunnel junction based MRAM for replacing high density DRAM circuits corresponding to 2X nm generation
المؤلفون: Ikegami, K., Shiota, Y., Nozaki, T., Abe, K., Noguchi, H., Yuasa, S., Suzuki, Y., Fujita, S.
المصدر: 2017 IEEE International Magnetics Conference (INTERMAG) Magnetics Conference (INTERMAG), 2017 IEEE International. :1-2 Apr, 2017
Relation: 2017 IEEE International Magnetics Conference (INTERMAG)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781538610862
تدمد:21504601
DOI:10.1109/INTMAG.2017.8007706