مؤتمر
Robustness in automotive electronics: An industrial overview of major concerns
العنوان: | Robustness in automotive electronics: An industrial overview of major concerns |
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المؤلفون: | Backhausen, U., Ballan, O., Bemardi, P., De Luca, S., Henzler, J., Kern, T., Piumatti, D., Rabenalt, T., Ramamoorthy, K.C., Sanchez, E., Sansonetti, A., Ullmann, R., Venini, F., Wiesner, R. |
المصدر: | 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS), 2017 IEEE 23rd International Symposium on. :157-162 Jul, 2017 |
Relation: | 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781538603529 9781538603512 |
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تدمد: | 19429401 |
DOI: | 10.1109/IOLTS.2017.8046234 |