مؤتمر
Low overhead test point insertion for scan-based BIST
| العنوان: | Low overhead test point insertion for scan-based BIST |
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| المؤلفون: | Nakao, M., Kobayashi, S., Hatayama, K., Iijima, K., Terada, S. |
| المصدر: | International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034) International test conference Test Conference, 1999. Proceedings. International. :348-357 1999 |
| Relation: | Proceedings of IEEE Computer Society International Test Conference (ICSM'99) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780357531 9780780357532 |
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| تدمد: | 10893539 |
| DOI: | 10.1109/TEST.1999.805649 |