Experimental study of Single Event Upsets on deep submicron and nano devices in space

التفاصيل البيبلوغرافية
العنوان: Experimental study of Single Event Upsets on deep submicron and nano devices in space
المؤلفون: Yu, Qingkui, Sun, Yi, Luo, Lei, Mei, Bo, Wei, Zhichao, Zhu, Ming, Tang, Min, Liu, Shufen
المصدر: 2017 Prognostics and System Health Management Conference (PHM-Harbin) Prognostics and System Health Management Conference (PHM-Harbin), 2017. :1-4 Jul, 2017
Relation: 2017 Prognostics and System Health Management Conference (PHM-Harbin)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781538603703
9781538603697
تدمد:21665656
DOI:10.1109/PHM.2017.8079299