Cavity mode analysis of highly strained direct bandgap germanium micro-bridge cavities

التفاصيل البيبلوغرافية
العنوان: Cavity mode analysis of highly strained direct bandgap germanium micro-bridge cavities
المؤلفون: Armand-Pilon, F., Zabel, T., Marin, E., Bonzon, C., Tardif, S., Gassenq, A., Pauc, N., Reboud, V., Calvo, V., Hartmann, J. M., Widiez, J., Chelnokov, A., Faist, J., Sigg, H.
المصدر: 2017 IEEE 14th International Conference on Group IV Photonics (GFP) Group IV Photonics (GFP), 2017 IEEE 14th International Conference on. :17-18 Aug, 2017
Relation: 2017 IEEE 14th International Conference on Group IV Photonics (GFP)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781509065684
9781509065677
تدمد:1949209X
DOI:10.1109/GROUP4.2017.8082174