دورية أكاديمية
A 14-nm FinFET Logic CMOS Process Compatible RRAM Flash With Excellent Immunity to Sneak Path
العنوان: | A 14-nm FinFET Logic CMOS Process Compatible RRAM Flash With Excellent Immunity to Sneak Path |
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المؤلفون: | Hsieh, E.R., Kuo, Y.C., Cheng, C., Kuo, J.L., Jiang, M., Lin, J., Chen, H., Chung, S.S., Liu, C., Chen, T.P., Huang, S.A., Chen, T., Cheng, O. |
المصدر: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 64(12):4910-4918 Dec, 2017 |
قاعدة البيانات: | IEEE Xplore Digital Library |
تدمد: | 00189383 15579646 |
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DOI: | 10.1109/TED.2017.2763960 |