دورية أكاديمية
On the Generation of Waveform-Accurate Hazard and Charge-Sharing Aware Tests for Transistor Stuck-Off Faults in CMOS Logic Circuits
| العنوان: | On the Generation of Waveform-Accurate Hazard and Charge-Sharing Aware Tests for Transistor Stuck-Off Faults in CMOS Logic Circuits |
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| المؤلفون: | Burchard, J., Erb, D., Reddy, S.M., Singh, A.D., Becker, B. |
| المصدر: | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 37(10):2152-2165 Oct, 2018 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 02780070 19374151 |
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| DOI: | 10.1109/TCAD.2017.2772825 |