دورية أكاديمية
On Enhancing Reliability of Weak PUFs via Intelligent Post-Silicon Accelerated Aging
| العنوان: | On Enhancing Reliability of Weak PUFs via Intelligent Post-Silicon Accelerated Aging |
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| المؤلفون: | Islam, M.N., Patil, V.C., Kundu, S. |
| المصدر: | IEEE Transactions on Circuits and Systems I: Regular Papers IEEE Trans. Circuits Syst. I Circuits and Systems I: Regular Papers, IEEE Transactions on. 65(3):960-969 Mar, 2018 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 15498328 15580806 |
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| DOI: | 10.1109/TCSI.2017.2766073 |