مؤتمر
Practical application of automated fault diagnosis for stuck-at, bridging, and measurement condition dependent faults in fully scanned sequential circuits
| العنوان: | Practical application of automated fault diagnosis for stuck-at, bridging, and measurement condition dependent faults in fully scanned sequential circuits |
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| المؤلفون: | Shimoda, R., Yoshida, T., Watari, M., Toyota, Y., Nishi, K., Motohara, A. |
| المصدر: | Proceedings Eighth Asian Test Symposium (ATS'99) Asian test symposium Test Symposium, 1999. (ATS '99) Proceedings. Eighth Asian. :347-353 1999 |
| Relation: | Proceedings of the Eighth Asian Test Symposium |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0769503152 9780769503158 |
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| تدمد: | 10817735 |
| DOI: | 10.1109/ATS.1999.810774 |