دورية أكاديمية
Single-Event Upset Mitigation in a Complementary SiGe HBT BiCMOS Technology
| العنوان: | Single-Event Upset Mitigation in a Complementary SiGe HBT BiCMOS Technology |
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| المؤلفون: | Lourenco, N.E., Ildefonso, A., Tzintzarov, G.N., Fleetwood, Z.E., Motoki, K., Paki, P., Kaynak, M., Cressler, J.D. |
| المصدر: | IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 65(1):231-238 Jan, 2018 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189499 15581578 |
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| DOI: | 10.1109/TNS.2017.2778803 |