دورية أكاديمية
The Mathematical Model of Contact Resistance and Injected Current in DRM Tests of SF6 Circuit Breaker
| العنوان: | The Mathematical Model of Contact Resistance and Injected Current in DRM Tests of SF6 Circuit Breaker |
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| المؤلفون: | Liu, Y., Zhang, G., Yang, J., Zhao, K., Gao, S. |
| المصدر: | IEEE Transactions on Components, Packaging and Manufacturing Technology IEEE Trans. Compon., Packag. Manufact. Technol. Components, Packaging and Manufacturing Technology, IEEE Transactions on. 8(1):82-87 Jan, 2018 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 21563950 21563985 |
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| DOI: | 10.1109/TCPMT.2017.2768400 |