مؤتمر
Total-dose tolerance of a chartered semiconductor 0.35-/spl mu/m CMOS process
| العنوان: | Total-dose tolerance of a chartered semiconductor 0.35-/spl mu/m CMOS process |
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| المؤلفون: | Lacoe, R.C., Osborn, J.V., Mayer, D.C., Witczak, S.C., Brown, S., Robertson, R., Hunt, D.R. |
| المصدر: | 1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.99TH8463) Radiation effects data workshop Radiation Effects Data Workshop, 1999. :82-86 1999 |
| Relation: | 1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780356608 9780780356603 |
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| DOI: | 10.1109/REDW.1999.816059 |