مؤتمر
Characterizing the impact of soft errors across microarchitectural structures and implications for predictability
العنوان: | Characterizing the impact of soft errors across microarchitectural structures and implications for predictability |
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المؤلفون: | Wibowo, Bagus, Agrawal, Abhinav, Tuck, James |
المصدر: | 2017 IEEE International Symposium on Workload Characterization (IISWC) Workload Characterization (IISWC), 2017 IEEE International Symposium on. :250-260 Oct, 2017 |
Relation: | 2017 IEEE International Symposium on Workload Characterization (IISWC) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781538612330 9781538612323 |
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DOI: | 10.1109/IISWC.2017.8167782 |