مؤتمر
Soft error considerations for deep-submicron CMOS circuit applications
| العنوان: | Soft error considerations for deep-submicron CMOS circuit applications |
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| المؤلفون: | Cohen, N., Sriram, T.S., Leland, N., Moyer, D., Butler, S., Flatley, R. |
| المصدر: | International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) Electron devices Electron Devices Meeting, 1999. IEDM '99. Technical Digest. International. :315-318 1999 |
| Relation: | International Electron Devices Meeting 1999. Technical Digest |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780354109 9780780354104 |
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| DOI: | 10.1109/IEDM.1999.824159 |