مؤتمر
Analysis and mitigation or IR-Drop induced scan shift-errors
| العنوان: | Analysis and mitigation or IR-Drop induced scan shift-errors |
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| المؤلفون: | Holst, Stefan, Schneider, Eric, Kawagoe, Koshi, Kochte, Michael A., Miyase, Kohei, Wunderlich, Hans-Joachim, Kajihara, Seiji, Wen, Xiaoqing |
| المصدر: | 2017 IEEE International Test Conference (ITC) Test Conference (ITC), 2017 IEEE International. :1-8 Oct, 2017 |
| Relation: | 2017 IEEE International Test Conference (ITC) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781538634134 |
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| تدمد: | 23782250 |
| DOI: | 10.1109/TEST.2017.8242055 |