Copper dual damascene interconnects with low-K (K/sub eff/

التفاصيل البيبلوغرافية
العنوان: Copper dual damascene interconnects with low-K (K/sub eff/
المؤلفون: Hasegawa, T., Ikeda, K., Tokunaga, K., Yamamura, I., Fukasawa, K., Kito, H., Miyata, K., Komai, N., Taguchi, M., Hirano, S., Tatsumi, T., Kadomura, S.
المصدر: International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) Electron devices Electron Devices Meeting, 1999. IEDM '99. Technical Digest. International. :623-626 1999
Relation: International Electron Devices Meeting 1999. Technical Digest
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:0780354109
9780780354104
DOI:10.1109/IEDM.1999.824230