التفاصيل البيبلوغرافية
العنوان: |
Research on failure analysis and method of GaN-based HEMTs |
المؤلفون: |
Yan-Fang, Chen, Wei-Ling, Guo, Yan-Xu, Zhu, Jian-Jun, Zhou, Liang, Lei, Chang-Qing, Bai |
المصدر: |
2017 14th China International Forum on Solid State Lighting: International Forum on Wide Bandgap Semiconductors China (SSLChina: IFWS) Solid State Lighting: International Forum on Wide Bandgap Semiconductors China (SSLChina: IFWS), 2017 14th China International Forum on. :179-182 Nov, 2017 |
Relation: |
2017 14th China International Forum on Solid State Lighting: International Forum on Wide Bandgap Semiconductors China (SSLChina: IFWS) |
قاعدة البيانات: |
IEEE Xplore Digital Library |