التفاصيل البيبلوغرافية
| العنوان: |
Research on failure analysis and method of GaN-based HEMTs |
| المؤلفون: |
Yan-Fang, Chen, Wei-Ling, Guo, Yan-Xu, Zhu, Jian-Jun, Zhou, Liang, Lei, Chang-Qing, Bai |
| المصدر: |
2017 14th China International Forum on Solid State Lighting: International Forum on Wide Bandgap Semiconductors China (SSLChina: IFWS) Solid State Lighting: International Forum on Wide Bandgap Semiconductors China (SSLChina: IFWS), 2017 14th China International Forum on. :179-182 Nov, 2017 |
| Relation: |
2017 14th China International Forum on Solid State Lighting: International Forum on Wide Bandgap Semiconductors China (SSLChina: IFWS) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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