دورية أكاديمية
Total Ionizing Dose Hardened and Mitigation Strategies in Deep Submicrometer CMOS and Beyond
العنوان: | Total Ionizing Dose Hardened and Mitigation Strategies in Deep Submicrometer CMOS and Beyond |
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المؤلفون: | Chatzikyriakou, E., Morgan, K., de Groot, C.H.K. |
المصدر: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 65(3):808-819 Mar, 2018 |
قاعدة البيانات: | IEEE Xplore Digital Library |
تدمد: | 00189383 15579646 |
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DOI: | 10.1109/TED.2018.2792305 |