دورية أكاديمية
Determination of Minority Carrier Lifetime of Holes in Diamond p-i-n Diodes Using Reverse Recovery Method
| العنوان: | Determination of Minority Carrier Lifetime of Holes in Diamond p-i-n Diodes Using Reverse Recovery Method |
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| المؤلفون: | Dutta, M., Mandal, S., Hathwar, R., Fischer, A.M., Koeck, F.A.M., Nemanich, R.J., Goodnick, S.M., Chowdhury, S. |
| المصدر: | IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 39(4):552-555 Apr, 2018 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 07413106 15580563 |
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| DOI: | 10.1109/LED.2018.2804978 |