مؤتمر
New method for observing self-heating effect using transistor efficiency signature
| العنوان: | New method for observing self-heating effect using transistor efficiency signature |
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| المؤلفون: | Mori, C. A. B., Agopian, P. G. D., Martino, J. A. |
| المصدر: | 2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2017 IEEE. :1-3 Oct, 2017 |
| Relation: | 2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781538637661 9781538637654 |
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| DOI: | 10.1109/S3S.2017.8309259 |