دورية أكاديمية
Bounded Reordering in the Distributed Test Architecture
| العنوان: | Bounded Reordering in the Distributed Test Architecture |
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| المؤلفون: | Hierons, R.M., Merayo, M.G., Nunez, M. |
| المصدر: | IEEE Transactions on Reliability IEEE Trans. Rel. Reliability, IEEE Transactions on. 67(2):522-537 Jun, 2018 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189529 15581721 |
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| DOI: | 10.1109/TR.2018.2800093 |