مؤتمر
Characterization of possibly detected faults by accurately computing their detection probability
العنوان: | Characterization of possibly detected faults by accurately computing their detection probability |
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المؤلفون: | Burchard, Jan, Erb, Dominik, Becker, Bernd |
المصدر: | 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2018. :385-390 Mar, 2018 |
Relation: | 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9783981926309 9783981926316 |
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تدمد: | 15581101 |
DOI: | 10.23919/DATE.2018.8342040 |