مؤتمر
Impact of process variations on the detectability of resistive short defects: Comparative analysis between 28nm Bulk and FDSOI technologies
| العنوان: | Impact of process variations on the detectability of resistive short defects: Comparative analysis between 28nm Bulk and FDSOI technologies |
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| المؤلفون: | Karel, Amit, Azais, Florence, Comte, Mariane, Galliere, Jean-Marc, Renovell, Michel |
| المصدر: | 2018 IEEE 19th Latin-American Test Symposium (LATS) Test Symposium (LATS), 2018 IEEE 19th Latin-American. :1-5 Mar, 2018 |
| Relation: | 2018 IEEE 19th Latin-American Test Symposium (LATS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781538614723 9781538614716 |
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| DOI: | 10.1109/LATW.2018.8349696 |