Characterization of an Associative Memory Chip in 28 nm CMOS Technology

التفاصيل البيبلوغرافية
العنوان: Characterization of an Associative Memory Chip in 28 nm CMOS Technology
المؤلفون: Annovi, Alberto, Calderini, Giovanni, Capra, Stefano, Checcucci, Bruno, Crescioli, Francesco, De Canio, Francesco, Fedi, Giacomo, Frontini, Luca, Garci, Maroua, Gentsos, Christos, Kubota, Takashi, Liberali, Valentino, Palla, Fabrizio, Shojaii, Jafar, Sotiropoulou, Calliope-Louisa, Stabile, Alberto, Traversi, Gianluca, Viret, Sebastien
المصدر: 2018 IEEE International Symposium on Circuits and Systems (ISCAS) Circuits and Systems (ISCAS), 2018 IEEE International Symposium on. :1-5 May, 2018
Relation: 2018 IEEE International Symposium on Circuits and Systems (ISCAS)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781538648810
تدمد:2379447X
DOI:10.1109/ISCAS.2018.8351801