مؤتمر
Self-heating-aware CMOS reliability characterization using degradation maps
| العنوان: | Self-heating-aware CMOS reliability characterization using degradation maps |
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| المؤلفون: | Bury, E., Chasin, A., Kaczer, B., Chuang, K.-H., Franco, J., Simicic, M., Weckx, P., Linten, D. |
| المصدر: | 2018 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2018 IEEE International. :2A.3-1-2A.3-6 Mar, 2018 |
| Relation: | 2018 IEEE International Reliability Physics Symposium (IRPS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781538654798 |
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| تدمد: | 19381891 |
| DOI: | 10.1109/IRPS.2018.8353541 |