دورية أكاديمية
Measurement and Analysis of Statistical IC Operation Errors in a Memory Module Due to System-Level ESD Noise
| العنوان: | Measurement and Analysis of Statistical IC Operation Errors in a Memory Module Due to System-Level ESD Noise |
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| المؤلفون: | Park, M., Park, J., Choi, J., Kim, J., Jeong, S., Seung, M., Lee, S. |
| المصدر: | IEEE Transactions on Electromagnetic Compatibility IEEE Trans. Electromagn. Compat. Electromagnetic Compatibility, IEEE Transactions on. 61(1):29-39 Feb, 2019 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189375 1558187X |
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| DOI: | 10.1109/TEMC.2018.2815641 |