Micro bump height derivation control with dynamic sizing patterning

التفاصيل البيبلوغرافية
العنوان: Micro bump height derivation control with dynamic sizing patterning
المؤلفون: Liu, C. C., Chen, J. H., Hsu, Y. N., Tsai, M. H., Hung, C. C., Wang, R. D., Liu, C. S., Pan, T. H., Chen, C. S., Liu, K. C., Ku, Harry
المصدر: 2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2018 29th Annual. :103-105 Apr, 2018
Relation: 2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781538637487
تدمد:23766697
DOI:10.1109/ASMC.2018.8373141