Introduction of Sub-2-micron Cu traces to EnCoRe enhanced copper redistribution layers for heterogeneous chip integration

التفاصيل البيبلوغرافية
العنوان: Introduction of Sub-2-micron Cu traces to EnCoRe enhanced copper redistribution layers for heterogeneous chip integration
المؤلفون: Kudo, Hiroshi, Aritsuka, Yuuki, Masaya, Tanaka, Kasai, Ryohei, Suyama, Jyunichi, Takeda, Mitsuhiro, Okazaki, Yumi, Iida, Haruo, Kitayama, Daisuke, Sakamoto, Kouji, Takano, Takamasa, Akazawa, Miyuki, Sato, Hiroaki, Yamada, Shouhei, Kuramochi, Satoru
المصدر: 2018 International Conference on Electronics Packaging and iMAPS All Asia Conference (ICEP-IAAC) Electronics Packaging and iMAPS All Asia Conference (ICEP-IAAC), 2018 International Conference on. :399-404 Apr, 2018
Relation: 2018 International Conference on Electronics Packaging and iMAPS All Asia Conference (ICEP-IAAC)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9784990218850
9784990218843
DOI:10.23919/ICEP.2018.8374332