مؤتمر
Reliability of compound semiconductor devices
| العنوان: | Reliability of compound semiconductor devices |
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| المؤلفون: | Fantini, F., Cattani, L., Dieci, D. |
| المصدر: | 2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400) Microelectronics Microelectronics, 2000. Proceedings. 2000 22nd International Conference on. 1:299-310 vol.1 2000 |
| Relation: | 2000 22nd International Conference on Microelectronics. Proceedings |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780352351 9780780352353 |
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| DOI: | 10.1109/ICMEL.2000.840578 |