HAXPES evaluation of ferroelectric HfSiO MIM capacitor

التفاصيل البيبلوغرافية
العنوان: HAXPES evaluation of ferroelectric HfSiO MIM capacitor
المؤلفون: Usuda, Koji, Kamimuta, Yuuichi, Kabuyanagi, Shoichi, Yoshiki, Masahiko, Tomita, Mitsuhiro, Saitoh, Masumi
المصدر: 2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference (EDTM) Electron Devices Technology and Manufacturing Conference (EDTM), 2018 IEEE 2nd. :316-318 Mar, 2018
Relation: 2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference (EDTM)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781538637128
9781538637111
DOI:10.1109/EDTM.2018.8421471