مؤتمر
Die Edge Crack Propagation Modeling for Risk Assessment of Advanced Technology Nodes
| العنوان: | Die Edge Crack Propagation Modeling for Risk Assessment of Advanced Technology Nodes |
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| المؤلفون: | Xu, Tingge, Wu, Zhuo-Jie, Zhang, Haojun, Graas, Carole, Justison, Patrick |
| المصدر: | 2018 IEEE 68th Electronic Components and Technology Conference (ECTC) ECTC Electronic Components and Technology Conference (ECTC), 2018 IEEE 68th. :2260-2266 May, 2018 |
| Relation: | 2018 IEEE 68th Electronic Components and Technology Conference (ECTC) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781538649992 |
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| تدمد: | 23775726 |
| DOI: | 10.1109/ECTC.2018.00340 |