مؤتمر
The role of the spacer oxide in determining worst-case hot-carrier stress conditions for NMOS LDD devices
| العنوان: | The role of the spacer oxide in determining worst-case hot-carrier stress conditions for NMOS LDD devices |
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| المؤلفون: | King, E.E., Lacoe, R.C., Wang-Ratkovic, J. |
| المصدر: | 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059) Reliability physics Reliability Physics Symposium, 2000. Proceedings. 38th Annual 2000 IEEE International. :83-92 2000 |
| Relation: | 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780358600 9780780358607 |
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| DOI: | 10.1109/RELPHY.2000.843895 |