مؤتمر
CMOS 3D-Extended Metal Gate ISFETs with Near Nernstian Ion Sensitivity
| العنوان: | CMOS 3D-Extended Metal Gate ISFETs with Near Nernstian Ion Sensitivity |
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| المؤلفون: | Zhang, Jun-Rui, Bellando, F., Rupakula, M., Cordero, E. Garcia, Ebejer, N., Longo, J., Wildhaber, F., Guerin, H., Ionescu, A.M. |
| المصدر: | 2018 76th Device Research Conference (DRC) Device Research Conference (DRC), 2018 76th. :1-2 Jun, 2018 |
| Relation: | 2018 76th Device Research Conference (DRC) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
| ردمك: | 9781538630273 9781538630280 |
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| DOI: | 10.1109/DRC.2018.8442197 |