دورية أكاديمية
Process Variation and NBTI Resilient Schmitt Trigger for Stable and Reliable Circuits
| العنوان: | Process Variation and NBTI Resilient Schmitt Trigger for Stable and Reliable Circuits |
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| المؤلفون: | Shah, A.P., Yadav, N., Beohar, A., Vishvakarma, S.K. |
| المصدر: | IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 18(4):546-554 Dec, 2018 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 15304388 15582574 |
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| DOI: | 10.1109/TDMR.2018.2866695 |