دورية أكاديمية
Predicting ${X}$ -Sensitivity of Circuit-Inputs on Test-Coverage: A Machine-Learning Approach
| العنوان: | Predicting ${X}$ -Sensitivity of Circuit-Inputs on Test-Coverage: A Machine-Learning Approach |
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| المؤلفون: | Pradhan, M., Bhattacharya, B.B., Chakrabarty, K. |
| المصدر: | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 38(12):2343-2356 Dec, 2019 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 02780070 19374151 |
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| DOI: | 10.1109/TCAD.2018.2878169 |