Measurement and Analysis of System-level ESD-induced Soft Failures of a Sense Amplifier Flip-Flop with Pseudo Differential Inputs

التفاصيل البيبلوغرافية
العنوان: Measurement and Analysis of System-level ESD-induced Soft Failures of a Sense Amplifier Flip-Flop with Pseudo Differential Inputs
المؤلفون: Jeong, Myeongjo, Park, Junsik, Kim, Jinwoo, Seung, Manho, Lee, Seokkiu, Kim, Jingook
المصدر: 2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2018 40th. :1-5 Sep, 2018
Relation: 2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781585373024
DOI:10.23919/EOS/ESD.2018.8509690