التفاصيل البيبلوغرافية
العنوان: |
Measurement and Analysis of System-level ESD-induced Soft Failures of a Sense Amplifier Flip-Flop with Pseudo Differential Inputs |
المؤلفون: |
Jeong, Myeongjo, Park, Junsik, Kim, Jinwoo, Seung, Manho, Lee, Seokkiu, Kim, Jingook |
المصدر: |
2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2018 40th. :1-5 Sep, 2018 |
Relation: |
2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) |
قاعدة البيانات: |
IEEE Xplore Digital Library |