مؤتمر
Breakdown measurements of ultra-thin SiO/sub 2/ at low voltage
| العنوان: | Breakdown measurements of ultra-thin SiO/sub 2/ at low voltage |
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| المؤلفون: | Stathis, J.H., Vayshenker, A., Varekamp, P.R., Wu, E.Y., Montrose, C., McKenna, J., DiMaria, D.J., Han, L.-K., Cartier, E., Wachnik, R.A., Linder, B.P. |
| المصدر: | 2000 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.00CH37104) VLSI technology VLSI Technology, 2000. Digest of Technical Papers. 2000 Symposium on. :94-95 2000 |
| Relation: | 2000 Symposium on VLSI Technology. Digest of Technical Papers |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780363051 9780780363052 |
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| DOI: | 10.1109/VLSIT.2000.852783 |