Temperature Impact on Surface Roughness Modeling for On-Package High Speed Interconnects

التفاصيل البيبلوغرافية
العنوان: Temperature Impact on Surface Roughness Modeling for On-Package High Speed Interconnects
المؤلفون: Geyik, Cemil S., Zhang, Zhichao, Christ, Sean R., Wojewoda, Leigh E., Aygun, Kemal
المصدر: 2018 IEEE 27th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS) Electrical Performance of Electronic Packaging and Systems (EPEPS), 2018 IEEE 27th Conference on. :271-273 Oct, 2018
Relation: 2018 IEEE 27th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781538693032
9781538651667
تدمد:21654115
DOI:10.1109/EPEPS.2018.8534203