دورية أكاديمية
Failure Thresholds in CBRAM Due to Total Ionizing Dose and Displacement Damage Effects
| العنوان: | Failure Thresholds in CBRAM Due to Total Ionizing Dose and Displacement Damage Effects |
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| المؤلفون: | Taggart, J.L., Jacobs-Gedrim, R.B., McLain, M.L., Barnaby, H.J., Bielejec, E.S., Hardy, W., Marinella, M.J., Kozicki, M.N., Holbert, K. |
| المصدر: | IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 66(1):69-76 Jan, 2019 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189499 15581578 |
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| DOI: | 10.1109/TNS.2018.2882529 |