A High-reliability Reading Scheme for STT-MRAM with a Symmetric Dual-reference Sensing Amplifier

التفاصيل البيبلوغرافية
العنوان: A High-reliability Reading Scheme for STT-MRAM with a Symmetric Dual-reference Sensing Amplifier
المؤلفون: Yan, Jin, Liu, Dong-Sheng, Yu, Hong-Mei, Meng, Hao, Liu, Peng
المصدر: 2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) Solid-State and Integrated Circuit Technology (ICSICT), 2018 14th IEEE International Conference on. :1-3 Oct, 2018
Relation: 2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781538644409
9781538644393
9781538644416
DOI:10.1109/ICSICT.2018.8565729