مؤتمر
A High-reliability Reading Scheme for STT-MRAM with a Symmetric Dual-reference Sensing Amplifier
العنوان: | A High-reliability Reading Scheme for STT-MRAM with a Symmetric Dual-reference Sensing Amplifier |
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المؤلفون: | Yan, Jin, Liu, Dong-Sheng, Yu, Hong-Mei, Meng, Hao, Liu, Peng |
المصدر: | 2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) Solid-State and Integrated Circuit Technology (ICSICT), 2018 14th IEEE International Conference on. :1-3 Oct, 2018 |
Relation: | 2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781538644409 9781538644393 9781538644416 |
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DOI: | 10.1109/ICSICT.2018.8565729 |