مؤتمر
Single-Event Characterization of 16 nm FinFET Xilinx UltraScale+ Devices with Heavy Ion and Neutron Irradiation
| العنوان: | Single-Event Characterization of 16 nm FinFET Xilinx UltraScale+ Devices with Heavy Ion and Neutron Irradiation |
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| المؤلفون: | Lee, David S., King, Michael, Evans, William, Cannon, Matthew, Perez-Celis, Andres, Anderson, Jordan, Wirthlin, Michael, Rice, William |
| المصدر: | 2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018) Nuclear & Space Radiation Effects Conference (NSREC 2018), 2018 IEEE. :1-8 Jul, 2018 |
| Relation: | 2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781538682623 9781538682630 |
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| تدمد: | 21540535 |
| DOI: | 10.1109/NSREC.2018.8584313 |