Scaling NC-FinFET to Sub-3 nm Nodes

التفاصيل البيبلوغرافية
العنوان: Scaling NC-FinFET to Sub-3 nm Nodes
المؤلفون: Pal, Ashish, Mittal, Sushant, Ghosh, Bahniman, Lin, Chieh Yu, Alexander, Blessy, Ayyagari, Buvna, Sachid, Angada B.
المصدر: 2018 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2018 IEEE. :1-2 Oct, 2018
Relation: 2018 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781538676271
9781538676264
DOI:10.1109/S3S.2018.8640184