مؤتمر
Device layout dimension impact on substrate effective resistivity
| العنوان: | Device layout dimension impact on substrate effective resistivity |
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| المؤلفون: | Rack, M., Nyssens, L., Raskin, J. -P., Lederer, D., Paganini, A., Shinde, M. B., Beganovic, A. |
| المصدر: | 2018 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2018 IEEE. :1-2 Oct, 2018 |
| Relation: | 2018 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
| ردمك: | 9781538676271 9781538676264 |
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| DOI: | 10.1109/S3S.2018.8640211 |