دورية أكاديمية
Visualizing Material Quality and Similarity of mc-Si Wafers Learned by Convolutional Regression Networks
العنوان: | Visualizing Material Quality and Similarity of mc-Si Wafers Learned by Convolutional Regression Networks |
---|---|
المؤلفون: | Demant, M., Virtue, P., Kovvali, A., Yu, S.X., Rein, S. |
المصدر: | IEEE Journal of Photovoltaics IEEE J. Photovoltaics Photovoltaics, IEEE Journal of. 9(4):1073-1080 Jul, 2019 |
قاعدة البيانات: | IEEE Xplore Digital Library |
تدمد: | 21563381 21563403 |
---|---|
DOI: | 10.1109/JPHOTOV.2019.2906037 |