دورية أكاديمية
Narrow Gap Detection in Microscope Images Using Marked Point Process Modeling
| العنوان: | Narrow Gap Detection in Microscope Images Using Marked Point Process Modeling |
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| المؤلفون: | Kim, D.W., Aguilar, C., Zhao, H., Comer, M.L. |
| المصدر: | IEEE Transactions on Image Processing IEEE Trans. on Image Process. Image Processing, IEEE Transactions on. 28(10):5064-5076 Oct, 2019 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 10577149 19410042 |
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| DOI: | 10.1109/TIP.2019.2910389 |