Investigation into SEU Effects and Hardening Strategies in SRAM Based FPGA

التفاصيل البيبلوغرافية
العنوان: Investigation into SEU Effects and Hardening Strategies in SRAM Based FPGA
المؤلفون: Li, Tianwen, Yang, Haigang, Zhao, He, Wang, Nan, Wei, Yuanfeng, Jia, Yiping
المصدر: 2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Radiation and Its Effects on Components and Systems (RADECS), 2017 17th European Conference on. :1-5 Oct, 2017
Relation: 2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781538612613
9781538612606
تدمد:16090438
DOI:10.1109/RADECS.2017.8696177