Improved electrical properties of MoS2 transistor with Hf1-xTixO as gate dielectric

التفاصيل البيبلوغرافية
العنوان: Improved electrical properties of MoS2 transistor with Hf1-xTixO as gate dielectric
المؤلفون: Zhao, Xinyuan, Xu, J. P., Liu, L., Lai, P.T., Tang, W. M.
المصدر: 2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) Electron Devices and Solid-State Circuits (EDSSC), 2019 IEEE International Conference on. :1-3 Jun, 2019
Relation: 2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781728102863
DOI:10.1109/EDSSC.2019.8754077